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Experimental Procedure

The Plasma Source Ion Implantation [11] technique was used to implant Ti-6Al-4V flats with nitrogen ions at relatively low temperatures. In PSII, targets are placed directly in a plasma source chamber and are then pulse-biased to high negative voltages. During this pulse, electrons are repelled from the target on the time scale of the electron plasma frequency which is short relative to the ion motion, leaving behind an ion matrix sheath. This sheath then expands and the ions uncovered by the sheath accelerate into the target with roughly normal incidence on all sides. This minimizes the sputtering of the target, thus maximizing the retained dose. The implants conducted for this paper were performed under typical PSII conditions. The base pressure was torr and the operating neutral pressure was torr. The bias pulses had a duration of 10s and a frequency of 100 Hz. The bias voltage was 50 kV and the delivered ion dose was atoms/cm. The retained dose was measured to be on the order of . Details of the retained dose measurements can be found elsewhere [12].

The targets implanted for this study were square flats (2.54 cm on a side, and 0.318 cm thick). They were cut from 15.24 cm bar and sheet stock, then prepared for implantation by mechanically grinding and polishing to a 0.06 m surface roughness (peak-to-valley). The original microstructure was plus intergranular , resulting from simple mill annealing.

The nitrogen concentration depth profiles produced by the ion implantation were measured using a scanning auger microprobe (SAM) equipped with an argon ion gun at an energy of 3 keV. Details of this analysis have been published prevly [12]. Of particular importance is the fact that an internal calibration technique was used to overcome the problem associated with the overlap of nitrogen and titanium peaks at an energy of 385 eV [13].

Both hardness and wear tests were conducted on implanted and unimplanted samples. The wear tests were conducted on a pin-on-disk wear tester, using a 3 mm diameter ruby ball as a stylus and Hank's solution as a lubricant. The rotational speed of the disk in these tests was 40 RPM, providing linear speeds of 25.1 and 31.4 mm/s, at track radii of 12 and 15 mm, respectively. Curves representing the wear depth as a function of the number of wear cycles were generated by repeatedly interrupting the wear test to measure the depth of the wear track using a profilometer. The pin-on-disk test rig was modified somewhat to assure that the location of the stylus was not altered by these interruptions.

The hardness tests were conducted using a nanoindenter [14], which is a depth-sensing instrument with a depth resolution of approximately 0.4 nm and a force resolution of approximately 0.3 N. The nanoindenter used for this study was built by Microscience, Inc. (Norwell, MA). The indenter used on this machine is a diamond Berkovitch indenter and calibration is used to account for the inevitable blunting of the indenter tip. The indents in the implanted sample were made in a 45 array at a spacing of 20 m in one direction and 30 m in the other direction. Some data was lost, though, due to insufficient storage space on the testing machine, so only fifteen of the 20 indentations yielded data. The indents in the unimplanted sample were made in a 33 array at a spacing of 30 m in both directions. For each of these indents, hardness values were recorded at several depths, yielding several data points for each specimen. These results were compared to finite element results in order to estimate the yield stress changes induced by the ion implantation.



Next: Finite Element Procedure Up: No Title Previous: Introduction


jake@
Wed Jul 13 13:48:06 CDT 1994